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A service and consulting institute for Focused Ion Beam (FIB) technologies, testing and failure analysis of microelectronic devices, and PCB design, FAB, and ...
charge neutralization  Gas-Assisted Etching  IC debugs  IC design alternation  IC modifications  IC testing pads  precision micromilling  Scanning Ion Microscope  TEM samples 
www.fibinternational.com - 2009-02-05
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