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  1. FIB International, Inc.

    A service and consulting institute for Focused Ion Beam (FIB) technologies, testing and failure analysis of microelectronic devices, and PCB design, FAB, and ...
    charge neutralization0
    Gas-Assisted Etching0
    IC debugs0
    IC design alternation0
    IC modifications0
    IC testing pads0
    precision micromilling0
    Scanning Ion Microscope0
    TEM samples0

    www.fibinternational.com - 2009-02-05

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